Paper
1 November 1990 Development of a low-contamination camera head for the evaluation of CCDs in the UV and EUV
Lawrence Shing, Robert A. Stern
Author Affiliations +
Abstract
A low contamination vacuum chamber and camera head built to test the ultraviolet and extreme ultraviolet response of charge-coupled devices are described. The vacuum chamber is of all electropolished stainless steel construction with copper seal flanges used throughout. The camera head includes a liquid-nitrogen-cooled, resistively heated thermal control system (+/- 0.1 C), and a specially recast epoxy ZIF socked. All electronic components, except wiring, are kept outside of the vacuum, eliminating major sources of organic contamination. The system is turbopumped and reaches pressures of about 10 exp -8 torr. Residual gas analysis of the system shows that partial pressures of organic contaminants are less than about 10 exp -9 torr.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lawrence Shing and Robert A. Stern "Development of a low-contamination camera head for the evaluation of CCDs in the UV and EUV", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); https://doi.org/10.1117/12.23282
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Cited by 1 scholarly publication.
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KEYWORDS
Charge-coupled devices

Head

Cameras

Extreme ultraviolet

CCD cameras

Copper

Contamination

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