1 November 1990 New approach to the study of microchannel-plate-sensitive surface
Author Affiliations +
Abstract
A new approach to study the composition of microchannel plate sensitive surface by secondary ion mass spectrometry is described. The time-of-flight technique is implemented in an unconventional way which permits using the continuous probing beam and concurrent multichannel mass identification. This makes the technique relatively simple, and the low doses and low probing beam intensities provide the opportunity to perform nondestructive analysis of thin layers and fragile films.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael A. Gruntman, Michael A. Gruntman, } "New approach to the study of microchannel-plate-sensitive surface", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23281; https://doi.org/10.1117/12.23281
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT

Calibration of the ROSAT High-Resolution Imager
Proceedings of SPIE (October 31 1990)
High-dynamic-range MCP structures
Proceedings of SPIE (September 30 1991)
Background reduction in microchannel plates
Proceedings of SPIE (October 31 1990)
ROSAT WFC imaging detectors
Proceedings of SPIE (October 31 1990)
Detecting x-rays with an optical imaging chamber
Proceedings of SPIE (October 07 1992)

Back to Top