1 November 1990 New approach to the study of microchannel-plate-sensitive surface
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A new approach to study the composition of microchannel plate sensitive surface by secondary ion mass spectrometry is described. The time-of-flight technique is implemented in an unconventional way which permits using the continuous probing beam and concurrent multichannel mass identification. This makes the technique relatively simple, and the low doses and low probing beam intensities provide the opportunity to perform nondestructive analysis of thin layers and fragile films.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael A. Gruntman, Michael A. Gruntman, } "New approach to the study of microchannel-plate-sensitive surface", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23281; https://doi.org/10.1117/12.23281


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