Objective crystal spectrometer for the SPECTRUM-X-gamma satellite

Finn Erland Christensen; B. P. Byrnak; Allan Hornstrup; Shou-Hua Zhu; Herbert W. Schnopper

doi:10.1117/12.23236

1 November 1990 Objective crystal spectrometer for the SPECTRUM-X-gamma satellite

Finn Erland Christensen, B. P. Byrnak, Allan Hornstrup, Shou-Hua Zhu, Herbert W. Schnopper

Proceedings Volume 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy; (1990) https://doi.org/10.1117/12.23236
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The status of the Objective Crystal Spectrometer (OXS) to be flown on the Soviet Spectrum-X-Gamma satellite together with the X-ray investigation of two of the three natural crystals (LiF(220), Ge(111) and RAP(001) which are chosen as the baseline option are presented. An important result of this study is the approximately 50 percent higher resolution obtained by polishing the LiF(220) surface. The measured X-ray data has been used to determine the OXS specifications. A simulation of the performance of the OXS for the LiF(220)-case are presented. A novel design in which multilayers are coated on the LiF(220) and Ge(111) surfaces is presented. This design allows simultaneous spectroscopy in two energy bands each centered on cosmically interesting line emission regions. X-ray reflectivity measurements demonstrate that the crystal surface can be made sufficiently smooth for the application of the multilayer coating. The first X-ray reflectivity data of multilayers deposited on these surfaces are also reported.

Citation Download Citation

Finn Erland Christensen, B. P. Byrnak, Allan Hornstrup, Shou-Hua Zhu, and Herbert W. Schnopper "Objective crystal spectrometer for the SPECTRUM-X-gamma satellite", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); https://doi.org/10.1117/12.23236

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