Proton damage effects in EEV charge-coupled devices

Andrew D. Holland; Anthony F. Abbey; David H. Lumb; Kieran J. McCarthy

doi:10.1117/12.23266

1 November 1990 Proton damage effects in EEV charge-coupled devices

Andrew D. Holland, Anthony F. Abbey, David H. Lumb, Kieran J. McCarthy

Proceedings Volume 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy; (1990) https://doi.org/10.1117/12.23266
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

An examination is conducted of the effects of low-energy protons on CCD performance to evaluate the potential effectiveness of space-borne observational instruments. Degradation is described as a function of incremental dose, irradiation temperature, or proton energy for several device architectures, some of which incorporate design features to minimize signal-charge/trapping-site interaction. Degradation of the charge transfer is studied for very low proton doses, and dark current is found to vary directly with proton dose. Displacement damage in the signal-transfer channels generates charge-trapping sites that have a negative effect on EEV CCD performance. Degradation of charge-transfer performance is shown to be the most significant hindrance to effective CCD operations for X-ray spectroscopic applications.

Citation Download Citation

Andrew D. Holland, Anthony F. Abbey, David H. Lumb, and Kieran J. McCarthy "Proton damage effects in EEV charge-coupled devices", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); https://doi.org/10.1117/12.23266

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