1 November 1990 Relative quantum efficiency measurements of CsI, CsBr, and CsI/CsBr coated microchannel plates
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Abstract
The soft X-ray quantum efficiencies of CsI and CsBr coated microchannel plates (MCPs) are described. These two materials are deposited on an MCP in quadrants. The quadrants are coated with CsI, CsBr, and a mixture of CsI and CsBr. The paper reports on the deposition techniques, background characteristics, imaging quality, and relative quantum efficiency over a selected range of X-ray energies from 0.1 KeV to 4.5 KeV.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rachel K. Martin, John H. Chappell, Stephen S. Murray, "Relative quantum efficiency measurements of CsI, CsBr, and CsI/CsBr coated microchannel plates", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23262; https://doi.org/10.1117/12.23262
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