PROCEEDINGS VOLUME 1345
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Advanced X-Ray/EUV Radiation Sources and Applications
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
Insertion Device Sources and Synchrotron Facilities
Proc. SPIE 1345, Status of the Advanced Light Source, 0000 (1 January 1991); https://doi.org/10.1117/12.23294
Proc. SPIE 1345, Status report on the Advanced Photon Source, summer 1990, 0000 (1 January 1991); https://doi.org/10.1117/12.23295
Proc. SPIE 1345, 8-GeV synchrotron radiation facility at Nishi-Harima, 0000 (1 January 1991); https://doi.org/10.1117/12.23297
Insertion Device Power
Proc. SPIE 1345, Power distribution from insertion device x-ray sources, 0000 (1 January 1991); https://doi.org/10.1117/12.23298
Proc. SPIE 1345, Mirrors as power filters, 0000 (1 January 1991); https://doi.org/10.1117/12.23300
Proc. SPIE 1345, Filter and window assemblies for high-power insertion device synchrotron radiation sources, 0000 (1 January 1991); https://doi.org/10.1117/12.23301
Proc. SPIE 1345, Experimental and analytical studies on fixed mask assembly for APS with enhanced cooling, 0000 (1 January 1991); https://doi.org/10.1117/12.23302
Proc. SPIE 1345, Penning discharge VUV and soft x-ray source, 0000 (1 January 1991); https://doi.org/10.1117/12.23303
Proc. SPIE 1345, VUV wall stabilized argon arc discharge source, 0000 (1 January 1991); https://doi.org/10.1117/12.23304
Time-Resolved Techniques
Proc. SPIE 1345, Time-resolved techniques: an overview, 0000 (1 January 1991); https://doi.org/10.1117/12.23305
Proc. SPIE 1345, Time-resolved x-ray scattering studies using CCD detectors, 0000 (1 January 1991); https://doi.org/10.1117/12.23306
Polarization Phenomena and Novel Optics
Proc. SPIE 1345, Survey of synchrotron radiation devices producing circular or variable polarization, 0000 (1 January 1991); https://doi.org/10.1117/12.23308
Proc. SPIE 1345, Techniques of production and analysis of polarized synchrotron radiation, 0000 (1 January 1991); https://doi.org/10.1117/12.23309
Proc. SPIE 1345, X-ray absorption spectroscopy with polarized synchrotron radiation, 0000 (1 January 1991); https://doi.org/10.1117/12.23310
Proc. SPIE 1345, Finite thickness effect of a zone plate on focusing hard x-rays, 0000 (1 January 1991); https://doi.org/10.1117/12.23311
Proc. SPIE 1345, Comparative study of carbon and boron carbide spacing layers inside soft x-ray mirrors, 0000 (1 January 1991); https://doi.org/10.1117/12.23312
Proc. SPIE 1345, Lateral-periodicity evaluation of multilayer Bragg reflector surface roughness using x-ray diffraction, 0000 (1 January 1991); https://doi.org/10.1117/12.23313
Proc. SPIE 1345, Broadband multilayer coated blazed grating for x-ray wavelengths below 0.6 nm, 0000 (1 January 1991); https://doi.org/10.1117/12.23314
Proc. SPIE 1345, Three materials soft x-ray mirrors: theory and application, 0000 (1 January 1991); https://doi.org/10.1117/12.23315
Proc. SPIE 1345, Plane and concave VUV and soft x-ray multilayered mirrors, 0000 (1 January 1991); https://doi.org/10.1117/12.23316
New Applications and Detectors
Proc. SPIE 1345, Soft x-ray spectro-microscope, 0000 (1 January 1991); https://doi.org/10.1117/12.23317
Proc. SPIE 1345, X-ray holography for sequencing DNA, 0000 (1 January 1991); https://doi.org/10.1117/12.23318
Proc. SPIE 1345, Polarization-dependent EXAFS studies in layered copper oxide superconductors, 0000 (1 January 1991); https://doi.org/10.1117/12.23319
Proc. SPIE 1345, Development of a synchrotron CCD-based area detector for structural biology, 0000 (1 January 1991); https://doi.org/10.1117/12.23322
Proc. SPIE 1345, Design and fabrication of x-ray/EUV optics for photoemission experimental beam line at Hefei National Synchrotron Radiation Lab., 0000 (1 January 1991); https://doi.org/10.1117/12.23323
Polarization Phenomena and Novel Optics
Proc. SPIE 1345, Soft and hard x-ray reflectivities of multilayers fabricated by alternating-material sputter deposition, 0000 (1 January 1991); https://doi.org/10.1117/12.23324
New Applications and Detectors
Proc. SPIE 1345, High-energy x-ray diffraction, 0000 (1 January 1991); https://doi.org/10.1117/12.23325
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