PROCEEDINGS VOLUME 1345
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING | 8-13 JULY 1990
Advanced X-Ray/EUV Radiation Sources and Applications
34TH ANNUAL INTERNATIONAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCE AND ENGINEERING
8-13 July 1990
San Diego, CA, United States
Insertion Device Sources and Synchrotron Facilities
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 2 (1 January 1991); doi: 10.1117/12.23294
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 11 (1 January 1991); doi: 10.1117/12.23295
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 16 (1 January 1991); doi: 10.1117/12.23297
Insertion Device Power
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 28 (1 January 1991); doi: 10.1117/12.23298
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 38 (1 January 1991); doi: 10.1117/12.23300
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 42 (1 January 1991); doi: 10.1117/12.23301
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 55 (1 January 1991); doi: 10.1117/12.23302
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 71 (1 January 1991); doi: 10.1117/12.23303
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 78 (1 January 1991); doi: 10.1117/12.23304
Time-Resolved Techniques
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 90 (1 January 1991); doi: 10.1117/12.23305
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 101 (1 January 1991); doi: 10.1117/12.23306
Polarization Phenomena and Novel Optics
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 116 (1 January 1991); doi: 10.1117/12.23308
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 125 (1 January 1991); doi: 10.1117/12.23309
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 137 (1 January 1991); doi: 10.1117/12.23310
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 146 (1 January 1991); doi: 10.1117/12.23311
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 165 (1 January 1991); doi: 10.1117/12.23312
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 180 (1 January 1991); doi: 10.1117/12.23313
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 189 (1 January 1991); doi: 10.1117/12.23314
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 198 (1 January 1991); doi: 10.1117/12.23315
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 225 (1 January 1991); doi: 10.1117/12.23316
New Applications and Detectors
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 245 (1 January 1991); doi: 10.1117/12.23317
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 255 (1 January 1991); doi: 10.1117/12.23318
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 260 (1 January 1991); doi: 10.1117/12.23319
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 270 (1 January 1991); doi: 10.1117/12.23322
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 281 (1 January 1991); doi: 10.1117/12.23323
Polarization Phenomena and Novel Optics
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 213 (1 January 1991); doi: 10.1117/12.23324
New Applications and Detectors
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, pg 234 (1 January 1991); doi: 10.1117/12.23325
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