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1 January 1991 Time-resolved x-ray scattering studies using CCD detectors
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Abstract
The advent of extremely bright x-ray beams from new low-emittance sources such as ESRF and APS offers new opportunities for materials research. One of the most exciting and technologically demanding areas is likely to be time-resolved x-ray studies. Our recent experiments at NSLS Brookhaven (Beamline X-16B) explore some of the challenges for time-resolved x-ray scattering combining developments in x-ray optics (dispersive geometry) area detectors (CCD''s) and fast data acquisition. The techniques are illustrated with results on the rapid thermal annealing of electronic materials including strained-layer InGai_As quantum-well structures. We describe the application of a new virtual-phase CCD detector for real-time diffraction studies at the microsecond time scale. 1.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roy Clarke, Waldemar Dos Passos, Walter P. Lowe, Brian G. Rodricks, and Christine M. Brizard "Time-resolved x-ray scattering studies using CCD detectors", Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); https://doi.org/10.1117/12.23306
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