1 January 1991 Measurements with a 35-psec gate time microchannel plate camera
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Abstract
Measurements of the x-ray gate time of 0. 2 mm thick microchannel plates with an LID aspect ratio of 20 as opposed to the more usual L/D demonstrate that gate times of 35 PS can be achieved. Good agreement with time dependent modelling is demonstrated L
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Perry M. Bell, Perry M. Bell, Joseph D. Kilkenny, Joseph D. Kilkenny, Roy L. Hanks, Roy L. Hanks, Otto L. Landen, Otto L. Landen, } "Measurements with a 35-psec gate time microchannel plate camera", Proc. SPIE 1346, Ultrahigh- and High-Speed Photography, Videography, Photonics, and Velocimetry '90, (1 January 1991); doi: 10.1117/12.23371; https://doi.org/10.1117/12.23371
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