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27 December 1990 Optical image subtraction using electron-trapping materials
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Abstract
An account is given of a novel incoherent-image subtraction technique employing ET materials, which possess no coherent noise, high resolution, gray level, high space-bandwidth product, high speed, and cost-effectiveness. The present ET devices are based on thin films of Ca(x)Sr(1-x)S:Eu, Ce, Sm. Prospective applications of this ET device encompass IC manufacture/inspection, data compression, and high-definition TV. Experimental results are presented.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Suganda Jutamulia, George M. Storti, William M. Seiderman, Joseph Lindmayer, and Don A. Gregory "Optical image subtraction using electron-trapping materials", Proc. SPIE 1347, Optical Information Processing Systems and Architectures II, (27 December 1990); https://doi.org/10.1117/12.23431
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