1 November 1990 Accurate characterization of error propagation in a highly parallel architecture
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Errors caused by faults in a system manifest themselves in the output results in various patterns. These output patterns of erroneous data the nature of their propagation through the various modules of the system and their impact on the system are collectively referred to as error characerisics. This paper deals with efficient methods of obtaining these error characteristics. Both experimental and analytical approaches to the problem are considered and a probabilistic approach to this problem is proposed. The effectiveness of this approach with respect to the accuracy of results and amount of computation involved is discussed.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Venugopal R. Shamapant, Venugopal R. Shamapant, Jacob A. Abraham, Jacob A. Abraham, D. G. Saab, D. G. Saab, } "Accurate characterization of error propagation in a highly parallel architecture", Proc. SPIE 1348, Advanced Signal Processing Algorithms, Architectures, and Implementations, (1 November 1990); doi: 10.1117/12.23505; https://doi.org/10.1117/12.23505


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