1 April 1991 Avalanche transistor selection for long-term stability in streak camera sweep and pulser applications
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Proceedings Volume 1358, 19th Intl Congress on High-Speed Photography and Photonics; (1991) https://doi.org/10.1117/12.24085
Event: 19th International Congress on High-Speed Photography and Photonics, 1990, Cambridge, United Kingdom
Abstract
We have identified the Motorola 2N4014 and 2N5551 and the Raytheon R53944 as three transistor types that exhibit avalanche characteristics and have long term collector breakdown voltage stability superior to other transistors tested. Stability on all types has been improved by power burnin. An automatic avalanche transistor burnin tester has been constructed to allow power burnin of up to 1008 transistors at a time. The tester is controlled by an IBM Personal Computer (PC) and can be programmed to acquire data, unattended, at any desired rate or period. Data are collected from each run and stored on a floppy disk in ASCII format. The data analysis software, RS/1 , was used for analysis and display. Data runs were typically 3 to 4 months long, with readings taken weekly. The transistors were biased into the avalanche or Zener region by individual current sources set to about 20% of the self-avalanche current for each type of transistor. Motorola, Zetex and National transistors were operated at 100 microamperes (pA), and the Raytheon units were operated at 20 pA. The electric field causes migration of material in the high field region at the surface near the collector-base junction, creating the voltage instability.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stan W. Thomas, Stan W. Thomas, Roger Lee Griffith, Roger Lee Griffith, Alan T. Teruya, Alan T. Teruya, } "Avalanche transistor selection for long-term stability in streak camera sweep and pulser applications", Proc. SPIE 1358, 19th Intl Congress on High-Speed Photography and Photonics, (1 April 1991); doi: 10.1117/12.24085; https://doi.org/10.1117/12.24085
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