1 March 1991 Reflectance anisotropy spectrometer for real-time crystal growth investigations
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Proceedings Volume 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization; (1991); doi: 10.1117/12.24360
Event: Physical Concepts of Materials for Novel Optoelectronic Device Applications, 1990, Aachen, Germany
Abstract
Since the last few years there is an increasing interest for materials dealing with nonlinear optical effects. Besides semiconductors, crystalls and organic materials specific attention has been paid to silicate glasses in which a CdSSe1 > microcrystalline phase is thermally developed. These glasses are the basis for a commercially available set of yellow-to-red "sharp cut" filters. Although these glasses have not been optimjzd3for nonlinear behaviour by now, they already show large nonlinear effects.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. Acher, Ramdane Benferhat, Bernard Drevillon, Manijeh Razeghi, "Reflectance anisotropy spectrometer for real-time crystal growth investigations", Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); doi: 10.1117/12.24360; https://doi.org/10.1117/12.24360
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KEYWORDS
Spectroscopy

Anisotropy

Reflectivity

Crystals

Ellipsometry

Signal detection

Signal processing

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