Characterization of the photorefractive effect in Ti:LiNbO3 stripe waveguides

Raimund Volk; Wolfgang Sohler

doi:10.1117/12.24471

1 February 1991 Characterization of the photorefractive effect in Ti:LiNbO₃ stripe waveguides

Raimund Volk, Wolfgang Sohler

Proceedings Volume 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications; (1991) https://doi.org/10.1117/12.24471
Event: Physical Concepts of Materials for Novel Optoelectronic Device Applications, 1990, Aachen, Germany

Abstract

To allow an extremely sensitive measurement of optically induced changes of the index of refraction in a Ti:LiNbO3 stripe waveguide a specific two wavelengths " excite and probe" technique has been recently developed [1J taking advantage of the large phase sensitivity of a waveguide resonator. A resolution of Ln 5 x iO has been achieved which is nearly two orders of magnitude better than demonstrated with conventional methods. For both polarizations and for several wavelengths in the visible and near infrared the most important parameters characterizing the photorefractive effect could be determined. They were evaluated by analyzing the measured index changes using a widely accepted theoretical model adopted to the waveguide geometry.

Citation Download Citation

Raimund Volk and Wolfgang Sohler "Characterization of the photorefractive effect in Ti:LiNbO₃ stripe waveguides", Proc. SPIE 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications, (1 February 1991); https://doi.org/10.1117/12.24471

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