1 February 1991 Corbino-capacitance technique for contactless measurements on conducting layers: application to persistent photoconductivity
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Proceedings Volume 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications; (1991) https://doi.org/10.1117/12.24502
Event: Physical Concepts of Materials for Novel Optoelectronic Device Applications, 1990, Aachen, Germany
Abstract
The technique utilizes the capacitive coupling between a pair of Corbino electrodes and a conducting layer placed on top of and insulated from the electrodes. Measurements on heterostructures of GaAs/GaAlAs and GaAs/GaInP are reported. The audiofrequency impedance exhibits ShubnikovdeHaas oscillations. These oscillations are used to investigate persistent photoconductiity at 0. 635 tm and 1. 00 jim illumination. The role played by contacts is discussed.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ole Per Hansen, Ole Per Hansen, Anders Kristensen, Anders Kristensen, Henrik Bruus, Henrik Bruus, Manijeh Razeghi, Manijeh Razeghi, } "Corbino-capacitance technique for contactless measurements on conducting layers: application to persistent photoconductivity", Proc. SPIE 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications, (1 February 1991); doi: 10.1117/12.24502; https://doi.org/10.1117/12.24502
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