1 February 1991 Long-term reliability tests on fused biconical taper couplers
Author Affiliations +
Proceedings Volume 1366, Fiber Optics Reliability: Benign and Adverse Environments IV; (1991) https://doi.org/10.1117/12.24723
Event: SPIE Microelectronic Interconnect and Integrated Processing Symposium, 1990, San Jose, United States
Over the last several years, fiber optic couplers manufactured via the fused biconical taper (FBT) process have been extensively used in a variety of fiber optic systems and instrumentation. However, because of the rapid development and deployment of this technology, there is only limited field data available regarding the long term performance and reliability of these components. In this paper some recent results of a such a study on FBT couplers will be reported. The test program consisted of accelerated heat and humidity tests, repetitive temperature cycling, mechanical shock and vibration tests as well as long term shelf tests. A review of the test data will be presented along with an estimate of component lifetimes.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Douglas R. Moore, Douglas R. Moore, "Long-term reliability tests on fused biconical taper couplers", Proc. SPIE 1366, Fiber Optics Reliability: Benign and Adverse Environments IV, (1 February 1991); doi: 10.1117/12.24723; https://doi.org/10.1117/12.24723


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