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1 February 1991 Optical cable reliability: lessons learned from post-mortem analyses
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Proceedings Volume 1366, Fiber Optics Reliability: Benign and Adverse Environments IV; (1991) https://doi.org/10.1117/12.24686
Event: SPIE Microelectronic Interconnect and Integrated Processing Symposium, 1990, San Jose, United States
Abstract
High reliability and low maintenance are critically important attributes of optical cable. Considering the service environment, we can predict some of the possible failure modes of optical cables and develop testing programs for them. However, it is unrealistic to expect that all modes of failure can be anticipated and understood quantitatively. Sometimes the cause of the failure is obvious but other times the cause of the failure is poorly understood and is worthy of further investigation. By conducting over 30 post-mortem analyses, we have gained an improved understanding of potential failure modes.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joyce P. Kilmer, Anthony DeVito, Hakan H. Yuce, Casey J. Wieczorek, John P. Varachi Jr., and William T. Anderson "Optical cable reliability: lessons learned from post-mortem analyses", Proc. SPIE 1366, Fiber Optics Reliability: Benign and Adverse Environments IV, (1 February 1991); https://doi.org/10.1117/12.24686
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