1 February 1991 Reliability assurance of optoelectronic devices in the local loop
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Proceedings Volume 1366, Fiber Optics Reliability: Benign and Adverse Environments IV; (1991) https://doi.org/10.1117/12.24722
Event: SPIE Microelectronic Interconnect and Integrated Processing Symposium, 1990, San Jose, United States
Abstract
Rapid development of Fiber-In-The-Loop (FITL) systems and FITL technology is bringing new challenges for assuring the reliability of optoelectronic devices. This can be attributed to several factors, some of which include: architecture, cost, useful lifetime of the optical source, and environmental conditions. Presently, relatively little is known about optoelectronic device reliability in the local loop. Thorough studies on the impact of loop applications and environments on the reliability of optoelectronic devices are essential. Although this paper will attempt to touch on most of the factors that need to be considered in any such study, the primary focus will be on the possible impact of loop environments on the reliability of optoelectronic devices and the methods required to help assure their reliability.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roy S. Koelbl, "Reliability assurance of optoelectronic devices in the local loop", Proc. SPIE 1366, Fiber Optics Reliability: Benign and Adverse Environments IV, (1 February 1991); doi: 10.1117/12.24722; https://doi.org/10.1117/12.24722
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