Paper
1 February 1991 Reliability of planar optical couplers
James E. Matthews III, Antoine Cucalon
Author Affiliations +
Proceedings Volume 1366, Fiber Optics Reliability: Benign and Adverse Environments IV; (1991) https://doi.org/10.1117/12.24699
Event: SPIE Microelectronic Interconnect and Integrated Processing Symposium, 1990, San Jose, United States
Abstract
Assessing the reliability of any product immediately brings to mind a rigorous set of tests and measurements. However, inspection and testing alone cannot ensure product reliability. Fundamental reliability must be designed into the product.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James E. Matthews III and Antoine Cucalon "Reliability of planar optical couplers", Proc. SPIE 1366, Fiber Optics Reliability: Benign and Adverse Environments IV, (1 February 1991); https://doi.org/10.1117/12.24699
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KEYWORDS
Reliability

Semiconducting wafers

Fiber optics

Ion exchange

Failure analysis

Integrated optics

Polymers

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