High-speed digital ellipsometer for the study of fiber optic sensor systems

Indu F. Saxena

doi:10.1117/12.24766

1 February 1991 High-speed digital ellipsometer for the study of fiber optic sensor systems

Indu F. Saxena

Author Affiliations +

Proceedings Volume 1367, Fiber Optic and Laser Sensors VIII; (1991) https://doi.org/10.1117/12.24766
Event: SPIE Microelectronic Interconnect and Integrated Processing Symposium, 1990, San Jose, United States

Abstract

The paper describes a high-speed digital ellipsometer, called 'discrete retardation modulation ellipsometer', designed for investigating fiber-optic sensor systems. The new device uses an electrooptic modulator to extract all four Stokes parameters and, thus, does not require lock-in amplifiers. The ellipsometer was used to measure the response of an optical fiber current sensor to test current at 4 kHz. The result was found to be within 10 percent from the expected value.

Citation Download Citation

Indu F. Saxena "High-speed digital ellipsometer for the study of fiber optic sensor systems", Proc. SPIE 1367, Fiber Optic and Laser Sensors VIII, (1 February 1991); https://doi.org/10.1117/12.24766

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