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1 February 1991 High-speed digital ellipsometer for the study of fiber optic sensor systems
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Proceedings Volume 1367, Fiber Optic and Laser Sensors VIII; (1991)
Event: SPIE Microelectronic Interconnect and Integrated Processing Symposium, 1990, San Jose, United States
The paper describes a high-speed digital ellipsometer, called 'discrete retardation modulation ellipsometer', designed for investigating fiber-optic sensor systems. The new device uses an electrooptic modulator to extract all four Stokes parameters and, thus, does not require lock-in amplifiers. The ellipsometer was used to measure the response of an optical fiber current sensor to test current at 4 kHz. The result was found to be within 10 percent from the expected value.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Indu F. Saxena "High-speed digital ellipsometer for the study of fiber optic sensor systems", Proc. SPIE 1367, Fiber Optic and Laser Sensors VIII, (1 February 1991);


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