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1 February 1991 Diffraction analysis of beams for barcode scanning
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Proceedings Volume 1384, High-Speed Inspection Architectures, Barcoding, and Character Recognition; (1991)
Event: Advances in Intelligent Robotics Systems, 1990, Boston, MA, United States
Laser based bar code scanners utilize large f/# beams to attain a large depth of focus. The intensity cross-section of the laser beam is generally not uniform but is frequently approximated by a Gaussian intensity profile. In the case of laser diodes the beam cross-section is a two dimensional distribution. It is well known that the focusing properties of large f/# Gaussian beams differ from the predictions of ray tracing techniques. Consequently analytic modeling of laser based bar code scanning systems requires techniques based on diffraction rather than on ray tracing in order to obtain agreement between theory and practice. The line spread function of the focused laser beam is generally the parameter of interest due to the one-dimensional nature of the bar code symbol. Some bar code scanners utilize an anamorphic optical system to produce a beam that that maintains an elliptical cross-section over an extended depth of focus. This elliptical beam shape is used to average over voids and other printing defects that occur in real world symbols. Since the scanner must operate over the maximum possible depth of field the beam emergent from the scanner must be analyzed in both its near field and far field regions in order to properly model the performance of the scanner.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jay M. Eastman and Anna Marie Quinn "Diffraction analysis of beams for barcode scanning", Proc. SPIE 1384, High-Speed Inspection Architectures, Barcoding, and Character Recognition, (1 February 1991);


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