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1 April 1991 Measurements and characterization of multiple-coupled interconnection lines in hybrid and monolithic integrated circuits
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Leonard A. Hayden, Jyh-Ming Jong, John B. Rettig, and Vijai K. Tripathi "Measurements and characterization of multiple-coupled interconnection lines in hybrid and monolithic integrated circuits", Proc. SPIE 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies, (1 April 1991); doi: 10.1117/12.25524; https://doi.org/10.1117/12.25524
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