1 August 1990 A survey and examination of subpixel measurement techniques
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Proceedings Volume 1395, Close-Range Photogrammetry Meets Machine Vision; 13951M (1990) https://doi.org/10.1117/12.2294301
Event: Close-Range Photogrammetry Meets Machine Vision, 1990, Zurich, Switzerland
Abstract
There is increasing use of electronic sensors and digital signal processing for measurements of optically acquired data. Applications include automatic inspection, surveying, remote sensing and photogrammetry. Sensors, at the present time, require subpixel methods to improve the resolution above that available given the spacing of sensing elements and the analogue to digital conversion resolution. This paper reviews proposed subpixel methods in the context of an increasingly important application, namely, the determination of the position of a laser spot on a sensing array for triangulation. A number of techniques are chosen and analysed experimentally. Their performances are compared and contrasted with respect to spatial resolution, quantisation accuracy and noise. For the comparison, use is made of simulated data, and real data obtained from a triangulation system9.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. A. W. West, T. A. Clarke, "A survey and examination of subpixel measurement techniques", Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13951M (1 August 1990); doi: 10.1117/12.2294301; https://doi.org/10.1117/12.2294301
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