1 August 1990 A survey and examination of subpixel measurement techniques
Author Affiliations +
Proceedings Volume 1395, Close-Range Photogrammetry Meets Machine Vision; 13951M (1990) https://doi.org/10.1117/12.2294301
Event: Close-Range Photogrammetry Meets Machine Vision, 1990, Zurich, Switzerland
There is increasing use of electronic sensors and digital signal processing for measurements of optically acquired data. Applications include automatic inspection, surveying, remote sensing and photogrammetry. Sensors, at the present time, require subpixel methods to improve the resolution above that available given the spacing of sensing elements and the analogue to digital conversion resolution. This paper reviews proposed subpixel methods in the context of an increasingly important application, namely, the determination of the position of a laser spot on a sensing array for triangulation. A number of techniques are chosen and analysed experimentally. Their performances are compared and contrasted with respect to spatial resolution, quantisation accuracy and noise. For the comparison, use is made of simulated data, and real data obtained from a triangulation system9.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. A. W. West, G. A. W. West, T. A. Clarke, T. A. Clarke, } "A survey and examination of subpixel measurement techniques", Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13951M (1 August 1990); doi: 10.1117/12.2294301; https://doi.org/10.1117/12.2294301


On noise in time-delay integration CMOS image sensors
Proceedings of SPIE (May 12 2016)
Range precision of direct-detection laser radar systems
Proceedings of SPIE (September 12 2004)
Fundamental Limits In Resolution Of Double Star Targets
Proceedings of SPIE (September 25 1989)
Image Tracking With Coherent Infrared Radars
Proceedings of SPIE (December 12 1983)

Back to Top