1 August 1990 Some solutions to vision dimensional metrology problems
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Proceedings Volume 1395, Close-Range Photogrammetry Meets Machine Vision; 13951P (1990) https://doi.org/10.1117/12.2294304
Event: Close-Range Photogrammetry Meets Machine Vision, 1990, Zurich, Switzerland
Abstract
New applications continue to emerge for machine vision and real-time photogrammetry, particularly in industrial inspection and biomedicine. Solutions to automation and practical problems are the key to the success of this relatively new technology. Calibration, illumination, edge definition and integration with a priori known information are addressed.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sabry F. El-Hakim, Sabry F. El-Hakim, } "Some solutions to vision dimensional metrology problems", Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13951P (1 August 1990); doi: 10.1117/12.2294304; https://doi.org/10.1117/12.2294304
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