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26 September 1978Computational Methods For Optical Thin Films
This paper reviews the Smith Chart and the characteristic matrix for evaluating the reflectance of optical thin films. The methods are developed from fundamentals and brief examples are given. The use of an HP-67 programmable calculator to make computations based on these methods is also discussed.
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Gary W. DeBell, "Computational Methods For Optical Thin Films," Proc. SPIE 0140, Optical Coatings: Applications and Utilization II, (26 September 1978); https://doi.org/10.1117/12.956264