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1 March 1991 Optical testing with wavelength scanning interferometer
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Abstract
Wavelength change in a unbalanced interferometer makes phase change in interferograms, and this phenomenon can be used for the purpose of phase shifting interferometry. As an example of measurements, an optical plane parallel plate is tested, and the simultaneous measurement of both front and rear surfaces together with inhomogeneity of refractive index can be carried out. A new method for calculating phase distribution is developed under the condition where nonlinearity of tuning wavelength and fluctuation of output power take place.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Katsuyuki Okada and Jumpei Tsujiuchi "Optical testing with wavelength scanning interferometer", Proc. SPIE 1400, Optical Fabrication and Testing, (1 March 1991); https://doi.org/10.1117/12.26113
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