Paper
1 July 1991 Experimental determination of recombination mechanisms in strained and unstrained quantum-well lasers
William C. Rideout
Author Affiliations +
Proceedings Volume 1418, Laser Diode Technology and Applications III; (1991) https://doi.org/10.1117/12.43797
Event: Optics, Electro-Optics, and Laser Applications in Science and Engineering, 1991, Los Angeles, CA, United States
Abstract
Carrier recombination rates are measured in both strained and unstrained quantum well lasers, and as far as possible the various physical mechanisms behind these recombination rates are separated out. The effect of Auger recombination on the higher than expected temperature sensitivity of threshold of 1.5 micrometers quantum well lasers is also examined.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William C. Rideout "Experimental determination of recombination mechanisms in strained and unstrained quantum-well lasers", Proc. SPIE 1418, Laser Diode Technology and Applications III, (1 July 1991); https://doi.org/10.1117/12.43797
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KEYWORDS
Semiconductor lasers

Laser applications

Laser damage threshold

Quantum wells

Bulk lasers

Heterojunctions

Temperature metrology

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