1 July 1991 High-resolution spectral characterization of high-power laser diodes
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Proceedings Volume 1418, Laser Diode Technology and Applications III; (1991) https://doi.org/10.1117/12.43833
Event: Optics, Electro-Optics, and Laser Applications in Science and Engineering, 1991, Los Angeles, CA, United States
Abstract
The combination of a scanning monochromator, a digitizing oscilloscope and a computer, allows time-resolved spectral measurements on laser diodes. The flexible system described covers a wide range of timescale, well below 1 microsecond(s) ec at a spectral resolution of down to 0.05 nm. With this system the authors have investigated quasi-cw laser diode bars that are designed for solid-state laser pumping, at various operating conditions. The time evolution of the center wavelength is quite well fitted by a square root function according to non-stationary thermodynamics. The measuring system enables judgement of the quality of mounting technique and helps in choosing the right heatsink to minimize the wavelength chirp during a light pulse.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Friedhelm Dorsch, "High-resolution spectral characterization of high-power laser diodes", Proc. SPIE 1418, Laser Diode Technology and Applications III, (1 July 1991); doi: 10.1117/12.43833; https://doi.org/10.1117/12.43833
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