1 July 1991 Technique for measuring stress-induced birefringence
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Proceedings Volume 1418, Laser Diode Technology and Applications III; (1991) https://doi.org/10.1117/12.43809
Event: Optics, Electro-Optics, and Laser Applications in Science and Engineering, 1991, Los Angeles, CA, United States
A technique has been developed to generate an image of the stress-induced birefringence which occurs in AlGaAs/GaAs ridge waveguides. Cross-sections of this image can be taken to yield quantitative results. A preliminary cross-sectional plot from a ridge waveguide shows that the birefringence is higher at the ridge edges due to stress caused by the waveguide structure, and agrees with the shape predicted by theory.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeffrey R. Heidel, Jeffrey R. Heidel, Mark S. Zediker, Mark S. Zediker, } "Technique for measuring stress-induced birefringence", Proc. SPIE 1418, Laser Diode Technology and Applications III, (1 July 1991); doi: 10.1117/12.43809; https://doi.org/10.1117/12.43809

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