Paper
15 September 1978 Electro-Optical Image Intensifier System To Study Lattice Rotation In Nonstop Uniaxial Tensile Tests On Aluminum Single Crystals
Narayan R. Joshi
Author Affiliations +
Proceedings Volume 0143, Applications of Electronic Imaging Systems; (1978) https://doi.org/10.1117/12.956557
Event: 1978 Technical Symposium East, 1978, Washington, D.C., United States
Abstract
A new X-ray system developed by Reifsnider and Green is used in this work for cine recording of Laue transmission X-ray diffraction patterns. This system incorporated a cascaded image intensifying tube and permits direct viewing and recording of Laue transmission X-ray diffraction patterns produced on a fluorescent screen, with exposure time as short as 1/220 sec. The tube used was RCA type C70021A, three stage, cascaded and magnetically focused. It was surrounded by a water cooled magnetic coil which supplies a uniform axial field of about 300G. The tube had 1:1 magnification and the diameter of both input and output screens was 3.8 cm. The fluorescent screen was positioned at a distance of 3 cm on the side of the specimen mounted on Instron testing machine opposite the X-ray source. A Super-Farron, f:0.87, 72 mm, wide angle, coupling lens corrected for 4 to 1 demagnification demagnified Laue transmission X-ray diffraction pattern of about 15.4 cm size from the fluorescent screen and projected it on to the 3.8 cm. photocathode of the image intensifying tube. Cine recording of changing Laue patterns in non-stop tensile testing of aluminum single crystals up to fracture revealed details of lattice rotation hitherto unnoticed in conventional deform, stop and shoot the picture tests.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Narayan R. Joshi "Electro-Optical Image Intensifier System To Study Lattice Rotation In Nonstop Uniaxial Tensile Tests On Aluminum Single Crystals", Proc. SPIE 0143, Applications of Electronic Imaging Systems, (15 September 1978); https://doi.org/10.1117/12.956557
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KEYWORDS
Crystals

Aluminum

X-rays

Image intensifiers

Single crystal X-ray diffraction

X-ray diffraction

Crystallography

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