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15 September 1978 The Dynamic Sampling Effect With Charge-Coupled Device (CCD) Imagers
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Proceedings Volume 0143, Applications of Electronic Imaging Systems; (1978) https://doi.org/10.1117/12.956547
Event: 1978 Technical Symposium East, 1978, Washington, D.C., United States
Abstract
Using CCD and CID image sensors, the array of detector elements performs a spatial sampling, which sets a maximum limit (Nyquist frequency) on the spatial resolution. In some sensors the MTF is high at and beyond the Nyquist frequency. By moving the sensor relative to the scene it is possible to obtain samples in between the stationary sampling positions. Thereby, the maximum spatial frequency limit is increased. This paper describes measurements with a CCD image sensor using this dynamic sampling effect. Resolution up to 3.5 times the Nyquist limit is shown. A theoretical calculation of expected obtainable MTF's for different sets of parameters is presented. This can be used to select parameters for best possible result when using the dynamic sampling effect.
© (1978) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andreas Nordbryhn "The Dynamic Sampling Effect With Charge-Coupled Device (CCD) Imagers", Proc. SPIE 0143, Applications of Electronic Imaging Systems, (15 September 1978); https://doi.org/10.1117/12.956547
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