PROCEEDINGS VOLUME 1437
OPTICS, ELECTRO-OPTICS, AND LASER APPLICATIONS IN SCIENCE AND ENGINEERING | 20-25 JANUARY 1991
Applied Spectroscopy in Material Science
Editor(s): David D. Saperstein
IN THIS VOLUME

5 Sessions, 24 Papers, 0 Presentations
OPTICS, ELECTRO-OPTICS, AND LASER APPLICATIONS IN SCIENCE AND ENGINEERING
20-25 January 1991
Los Angeles, CA, United States
Carbon Thin Films
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 2 (1 April 1991); doi: 10.1117/12.45125
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 13 (1 April 1991); doi: 10.1117/12.45126
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 32 (1 April 1991); doi: 10.1117/12.45127
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 36 (1 April 1991); doi: 10.1117/12.45128
Infrared Fiber Optics
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 44 (1 April 1991); doi: 10.1117/12.45129
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 54 (1 April 1991); doi: 10.1117/12.45130
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 60 (1 April 1991); doi: 10.1117/12.45131
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 66 (1 April 1991); doi: 10.1117/12.45132
Spectroscopic Surface Analysis
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 76 (1 April 1991); doi: 10.1117/12.45133
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 80 (1 April 1991); doi: 10.1117/12.45134
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 89 (1 April 1991); doi: 10.1117/12.45135
Lasers in Mass Spectroscopy
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 112 (1 April 1991); doi: 10.1117/12.45136
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 124 (1 April 1991); doi: 10.1117/12.45137
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 129 (1 April 1991); doi: 10.1117/12.45138
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 138 (1 April 1991); doi: 10.1117/12.45139
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 150 (1 April 1991); doi: 10.1117/12.45140
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 157 (1 April 1991); doi: 10.1117/12.45141
New Techniques and Applications
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 168 (1 April 1991); doi: 10.1117/12.45142
Spectroscopic Surface Analysis
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 95 (1 April 1991); doi: 10.1117/12.45143
New Techniques and Applications
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 184 (1 April 1991); doi: 10.1117/12.45144
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 194 (1 April 1991); doi: 10.1117/12.45145
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 198 (1 April 1991); doi: 10.1117/12.45146
Spectroscopic Surface Analysis
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 103 (1 April 1991); doi: 10.1117/12.45147
Carbon Thin Films
Proc. SPIE 1437, Applied Spectroscopy in Material Science, pg 24 (1 April 1991); doi: 10.1117/12.45148
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