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1 April 1991 Integrating FTIR microscopy into surface analysis
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Proceedings Volume 1437, Applied Spectroscopy in Material Science; (1991)
Event: Optics, Electro-Optics, and Laser Applications in Science and Engineering, 1991, Los Angeles, CA, United States
The chemical information obtained from a sample by the techniques of Fourier Transform Infrared (FTIR) microscopy and small spot Electron Spectroscopy for Chemical Analysis (ESCA) can be very complementary. The basics of both of these analytical techniques will be discussed and case studies showing how the data from these techniques can be combined to provide a powerful tool for industrial problem solving and materials characterization, will be presented.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeffrey S. Church "Integrating FTIR microscopy into surface analysis", Proc. SPIE 1437, Applied Spectroscopy in Material Science, (1 April 1991);

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