PROCEEDINGS VOLUME 1438
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS 1989 | 1-3 NOVEMBER 1989
Laser-Induced Damage in Optical Materials 1989
IN THIS VOLUME

1 Sessions, 60 Papers, 0 Presentations
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS 1989
1-3 November 1989
Boulder, CO, United States
Laser-Induced Damage in Optical Materials
Proc. SPIE 1438, Front Matter: Volume 1438, 143801 (1 November 1990); https://doi.org/10.1117/12.2294472
Proc. SPIE 1438, A set of standard definitions for laser damage parameters and procedures, 143802 (1 November 1990); https://doi.org/10.1117/12.2294411
Proc. SPIE 1438, Optical characterization of transparent materials using ellipsometry, 143803 (1 November 1990); https://doi.org/10.1117/12.2294412
Proc. SPIE 1438, Microindentation as a technique for assessing subsurface damage in optics, 143804 (1 November 1990); https://doi.org/10.1117/12.2294413
Proc. SPIE 1438, Automated damage testing facility for excimer laser optics, 143805 (1 November 1990); https://doi.org/10.1117/12.2294414
Proc. SPIE 1438, Expanded damage test facilities at LLNL, 143806 (1 November 1990); https://doi.org/10.1117/12.2294415
Proc. SPIE 1438, Laser Damage Database at 1064 nm, 143807 (1 November 1990); https://doi.org/10.1117/12.2294416
Proc. SPIE 1438, Damage measurements on optical materials for use in high-peak-power lasers, 143808 (1 November 1990); https://doi.org/10.1117/12.2294417
Proc. SPIE 1438, Laser induced damage to thallium arsenic selenide (TAS), 143809 (1 November 1990); https://doi.org/10.1117/12.2294418
Proc. SPIE 1438, Laser induced damage in Schott's 0G-550 optical absorption glass, 14380A (1 November 1990); https://doi.org/10.1117/12.2294419
Proc. SPIE 1438, Effects of laser damage processes on microwave propagation, 14380B (1 November 1990); https://doi.org/10.1117/12.2294420
Proc. SPIE 1438, Laser-induced damage to silicon photosensor arrays, 14380C (1 November 1990); https://doi.org/10.1117/12.2294421
Proc. SPIE 1438, Sensitive n2 measurements using a single beam, 14380D (1 November 1990); https://doi.org/10.1117/12.2294422
Proc. SPIE 1438, Optical breakdown in particle suspension, 14380E (1 November 1990); https://doi.org/10.1117/12.2294423
Proc. SPIE 1438, Annealing if induced damage in fluoride glass components, 14380F (1 November 1990); https://doi.org/10.1117/12.2294424
Proc. SPIE 1438, The effect of laser annealing on laser induced damage threshold, 14380G (1 November 1990); https://doi.org/10.1117/12.2294425
Proc. SPIE 1438, Shockwave detection: an efficient way to determine multiple-pulse damage thresholds, 14380H (1 November 1990); https://doi.org/10.1117/12.2294426
Proc. SPIE 1438, Application of the Ronchi ruling beam profiling method to axially symmetric laser beams, 14380I (1 November 1990); https://doi.org/10.1117/12.2294427
Proc. SPIE 1438, Prediction Of laser induced damage by comparison of laser fluence profile to damage spot radius, 14380J (1 November 1990); https://doi.org/10.1117/12.2294428
Proc. SPIE 1438, IR laser beam profiling using quenched fluorescence, 14380K (1 November 1990); https://doi.org/10.1117/12.2294429
Proc. SPIE 1438, Laser-induced failure in biased silicon avalanche photodiodes, 14380L (1 November 1990); https://doi.org/10.1117/12.2294430
Proc. SPIE 1438, The effect of subsurface defects on "incipient" (below threshold) laser damage nucleation in fused silica optical flats, 14380M (1 November 1990); https://doi.org/10.1117/12.2294431
Proc. SPIE 1438, Quantitative analysis of surface trace metal contamination on substrates and films by TXRF, 14380N (1 November 1990); https://doi.org/10.1117/12.2294432
Proc. SPIE 1438, An error analysis of the Wyko TOPO noncontact surface profiler, 14380O (1 November 1990); https://doi.org/10.1117/12.2294433
Proc. SPIE 1438, Ultra-precision grinding of LHG-8 laser glass and laser damage thresholds, 14380P (1 November 1990); https://doi.org/10.1117/12.2294434
Proc. SPIE 1438, Low scatter surfaces on silicon carbide, 14380Q (1 November 1990); https://doi.org/10.1117/12.2294435
Proc. SPIE 1438, Physical limits on ultra-high Albedo diffuse reflectors, 14380R (1 November 1990); https://doi.org/10.1117/12.2294436
Proc. SPIE 1438, Optical damage on SiO2 cavity mirrors produced by high-power VUV laser irradiation, 14380S (1 November 1990); https://doi.org/10.1117/12.2294437
Proc. SPIE 1438, Damage assessment and possible damage mechanisms to 1-meter diameter nova turning mirrors, 14380T (1 November 1990); https://doi.org/10.1117/12.2294438
Proc. SPIE 1438, Thermal transport studies of optical coatings, interfaces and surfaces by thermal diffusion wave interferometry, 14380U (1 November 1990); https://doi.org/10.1117/12.2294439
Proc. SPIE 1438, Investigation of thin films using total internal reflection microscopy, 14380V (1 November 1990); https://doi.org/10.1117/12.2294440
Proc. SPIE 1438, Scattering characterization of materials in thin film form, 14380W (1 November 1990); https://doi.org/10.1117/12.2294441
Proc. SPIE 1438, Optical properties and laser damage measurements of inorganic polymer films, 14380X (1 November 1990); https://doi.org/10.1117/12.2294442
Proc. SPIE 1438, Interfacial stability in optical coatings, 14380Y (1 November 1990); https://doi.org/10.1117/12.2294443
Proc. SPIE 1438, Surface analytical methods for the assessment of damage in optical thin films, 14380Z (1 November 1990); https://doi.org/10.1117/12.2294444
Proc. SPIE 1438, Laser conditioning of optical thin films, 143810 (1 November 1990); https://doi.org/10.1117/12.2294445
Proc. SPIE 1438, Large area laser conditioning of dielectiic thin film mirrors, 143811 (1 November 1990); https://doi.org/10.1117/12.2294446
Proc. SPIE 1438, Population distribution of conditioned damage thresholds on AR coated BK-7 glass with varying laser spot size, 143812 (1 November 1990); https://doi.org/10.1117/12.2294447
Proc. SPIE 1438, Damage threshold measurements of reflective and transmissive optics at 130 nm, 143813 (1 November 1990); https://doi.org/10.1117/12.2294448
Proc. SPIE 1438, Laser induced damage thresholds of dielectric coatings at 193 nm and correlations to optical constants and process parameters, 143814 (1 November 1990); https://doi.org/10.1117/12.2294449
Proc. SPIE 1438, Angular dependence of thin-film dielectric coating damage thresholds revisited, 143815 (1 November 1990); https://doi.org/10.1117/12.2294450
Proc. SPIE 1438, Pulse-width dependence of optical coating damage at 1052 nm, 143816 (1 November 1990); https://doi.org/10.1117/12.2294451
Proc. SPIE 1438, Damage resistant optical coatings prepared using high temperature, plasma chemical-vapor-deposition, 143817 (1 November 1990); https://doi.org/10.1117/12.2294452
Proc. SPIE 1438, A high temperature, plasma-assisted chemical vapor deposition system, 143818 (1 November 1990); https://doi.org/10.1117/12.2294453
Proc. SPIE 1438, The evolution of molecular beam deposition (MBD) from laboratory to production usage, 143819 (1 November 1990); https://doi.org/10.1117/12.2294454
Proc. SPIE 1438, Investigation and modelling of laser-damage properties of Fabry-Perot filters, 14381A (1 November 1990); https://doi.org/10.1117/12.2294455
Proc. SPIE 1438, High damage threshold A10.0H-Si02 HR coatings prepared by the sol-gel process, 14381B (1 November 1990); https://doi.org/10.1117/12.2294456
Proc. SPIE 1438, 1-on-1 And n-on-1 laser strength of binder aided ZrO2 and ZrO2-SiO2 reflective sol-gel coatings, 14381C (1 November 1990); https://doi.org/10.1117/12.2294457
Proc. SPIE 1438, Structural modification of D20/H2O-dosed CaF2 optical thin films, 14381D (1 November 1990); https://doi.org/10.1117/12.2294458
Proc. SPIE 1438, Non-avalanche dielectric breakdown in wide-band-gap insulators at DC and optical frequencies, 14381E (1 November 1990); https://doi.org/10.1117/12.2294459
Proc. SPIE 1438, UV seeding of IR laser induced damage, 14381F (1 November 1990); https://doi.org/10.1117/12.2294460
Proc. SPIE 1438, Measurements of UV induced absorption in dielectric coatings, 14381G (1 November 1990); https://doi.org/10.1117/12.2294461
Proc. SPIE 1438, The response of multilayer dielectric coatings to low fluence ultraviolet light exposure, 14381H (1 November 1990); https://doi.org/10.1117/12.2294462
Proc. SPIE 1438, Radiation damage in single crystal CsI(T1) and polycrystal CsI, 14381I (1 November 1990); https://doi.org/10.1117/12.2294463
Proc. SPIE 1438, Effects of thermal conductivity and index of refraction variation on the inclusion dominated model of laser-induced damage, 14381J (1 November 1990); https://doi.org/10.1117/12.2294464
Proc. SPIE 1438, Theoretical determination of the nonlinear optical properties of inorganic polymers, 14381K (1 November 1990); https://doi.org/10.1117/12.2294465
Proc. SPIE 1438, Relation between N2 and two-photon absorption, 14381L (1 November 1990); https://doi.org/10.1117/12.2294466
Proc. SPIE 1438, Photoconductivity of ZnS and ZnSe, 14381M (1 November 1990); https://doi.org/10.1117/12.2294467