1 November 1990 Sensitive n2 measurements using a single beam
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Abstract
We present a sensitive single beam technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than A/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond visible laser pulses.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Sheik-Bahae, "Sensitive n2 measurements using a single beam", Proc. SPIE 1438, Laser-Induced Damage in Optical Materials 1989, 14380D (1 November 1990); doi: 10.1117/12.2294422; https://doi.org/10.1117/12.2294422
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