1 December 1991 Thermoelectric voltage in slant-angle-deposited metallic films
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Proceedings Volume 1440, Optical Radiation Interaction with Matter; (1991) https://doi.org/10.1117/12.48177
Event: Optical Radiation Interaction with Matter, 1990, Leningrad, Russian Federation
Abstract
The thermoelectric voltage induced in the slant-angle deposited metallic films by light has been investigated. It is found that the magnitude of this voltage depends on the surface morphology and the width of the films. The physical models of this phenomenon discussed in the present work permit choosing of the optimum geometry of the film layer in manufacturing non-selective detectors of radiation.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. I. Verechshagin, Ya. A. Oksman, "Thermoelectric voltage in slant-angle-deposited metallic films", Proc. SPIE 1440, Optical Radiation Interaction with Matter, (1 December 1991); doi: 10.1117/12.48177; https://doi.org/10.1117/12.48177
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