1 June 1991 Simple high-precision extinction method for measuring refractive index of transparent materials
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Abstract
Linearly polarized light remains linearly polarized after reflection from a transparent material at oblique incidence. The reflected polarization angle is determined from the extinction position of the analyzer. If the incident polarization angle is 45 deg, the reflected polarization angle gives the ratio of the reflected p-wave to s-wave. This value can be used to determine the index of refraction from Fresnel equations. With our instrument, the uncertainty in the deduced refractive index is +/- 0.0004. This method is fast, convenient, and versatile enough to provide accurate results on small laboratory samples. In addition to measuring the refractive index, the method is sufficiently accurate to characterize the homogeneity of transparent materials.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Soe-Mie F. Nee, Soe-Mie F. Nee, Harold E. Bennett, Harold E. Bennett, } "Simple high-precision extinction method for measuring refractive index of transparent materials", Proc. SPIE 1441, Laser-Induced Damage in Optical Materials: 1990, (1 June 1991); doi: 10.1117/12.27512; https://doi.org/10.1117/12.27512
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