Performance tests of large CCDs

Lloyd B. Robinson; William E. Brown; David Kirk Gilmore; Richard J. Stover; Mingzhi Wei; John C. Geary

doi:10.1117/12.45326

1 July 1991 Performance tests of large CCDs

Lloyd B. Robinson, William E. Brown, David Kirk Gilmore, Richard J. Stover, Mingzhi Wei, John C. Geary

Proceedings Volume 1447, Charge-Coupled Devices and Solid State Optical Sensors II; (1991) https://doi.org/10.1117/12.45326
Event: Medical Imaging '91, 1991, San Jose, CA, United States

Abstract

Results obtained in fabricating and testing of large CCD image sensors are reported. The emphasis is on high quantum efficiency, excellent charge transfer efficiency at low signal level, large pixel count, low readout noise, and very low dark current. The focus is on the use of the devices for optical astronomy where these parameters are most important. Test results for CCDs fabricated by Ford Aerospace and by EG Experiments to demonstrate the feasibility of a reproducible biased-gate using transparent indium tin oxide as a conducting layer over a silicon oxide insulating layer are discussed. Quantum efficiency of bias-gate thinned CCDs is compared with results obtained from a phosphor-coated front- illuminated CCD.

Citation Download Citation

Lloyd B. Robinson, William E. Brown, David Kirk Gilmore, Richard J. Stover, Mingzhi Wei, and John C. Geary "Performance tests of large CCDs", Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); https://doi.org/10.1117/12.45326

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