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1 June 1991 Detection with a charge-coupled device in atomic emission spectroscopy
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Proceedings Volume 1448, Camera and Input Scanner Systems; (1991)
Event: Electronic Imaging '91, 1991, San Jose, CA, United States
Multichannel detectors offer potential advantages over single-channel detectors in analytical plasma emission spectroscopy because of the wealth of information available in the spectrum. Simultaneous detection over a wide wavelength range provides information which can be used to improve accuracy, precision, and reliability. The very large dynamic range of plasma sources exceeds the dynamic range of common array detectors however, so means for changing the integration time between faint and intense spectral lines are required. To be successful, this approach requires that saturated areas of the detector do not spill photogenerated charge into adjacent areas (bloom). The application of a recently introduced, large-format, anti-blooming CCD to atomic emission spectroscopy is described. The results of the characterization of the performance parameters of the camera system relevant to analytical emission spectroscopy are presented. The camera system is used with a custom-built spectrometer based on an echelle grating and a CaF2 prism. The performance of the spectrometer, as well as design trade-offs, is described. Examples of emission spectra recorded with the instrument and a discussion of qualitative and quantitative analysis are presented.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert B. Bilhorn "Detection with a charge-coupled device in atomic emission spectroscopy", Proc. SPIE 1448, Camera and Input Scanner Systems, (1 June 1991);

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