Paper
1 June 1991 Method of estimating light loadings power and repetition frequency effects on the image quality of gated image intensifier tubes
Boris Efimovich Dashevsky
Author Affiliations +
Proceedings Volume 1449, Electron Image Tubes and Image Intensifiers II; (1991) https://doi.org/10.1117/12.44274
Event: Electronic Imaging '91, 1991, San Jose, CA, United States
Abstract
The photocathode surface resistance influence on the illuminance allowable level is studied both experimentally and analytically with due regard to the intensifier's photocathode unit design. Another subject of investigation is the effect of the repetition frequency of light pulses, commensurable in duration with gating voltage pulses of the shutter, on the tube spatial resolution. Experiments were staged using fabricated annular gate electrode image intensifiers. A novel design of the photocathode unit, the so-called capacitor substrata, has been proposed and tested in the tubes under investigation. Basing on theoretical analysis results, simplified equivalent electrical circuits are proposed. They enable a qualitative analysis of the photocathode unit to be easily performed. Also reported are experimentally obtained dependences of the critical allowable photocathode illuminance value upon the light pulse width as well as the relationship between the spatial resolution and the repetition frequency of such pulses for two versions of the photocathode unit design. The investigations demonstrated in particular that when the capacitor substrata is used, the critical allowable photocathode illuminance increases fourfold.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Boris Efimovich Dashevsky "Method of estimating light loadings power and repetition frequency effects on the image quality of gated image intensifier tubes", Proc. SPIE 1449, Electron Image Tubes and Image Intensifiers II, (1 June 1991); https://doi.org/10.1117/12.44274
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KEYWORDS
Image intensifiers

Capacitance

Electrons

Spatial resolution

Resistance

Camera shutters

Electrodes

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