1 February 1991 AEDC direct-write scene generation test capabilities
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Abstract
A scene generation capability is under development at the Arnold Engineering Development Center (AEDC) for visible and lR focal plane array (FPA) testing that uses two-axis acousto-optic (AO) deflectors. A multifrequency RF input creates a rake of output beams which is step-scanned across the face of the imaging device. Each component of the rake is modulated independently, and the beams are blanked during the shift from one row of pixels to the next. The expected maximum frame rate is 20 kHz, with operation synchronized to the operation of the FPA. A modular concept is being investigated to address large (51 2 x 512 pixel) FPAs. This AEDC Direct Write Scene Generation (DW5G) technology is being applied toward development of a transportable and a fixed-site Scene Generation Test Capability (SGTC).
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Heard S. Lowry, Heard S. Lowry, Parker David Elrod, Parker David Elrod, Rick J. Johnson, Rick J. Johnson, } "AEDC direct-write scene generation test capabilities", Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991); doi: 10.1117/12.28044; https://doi.org/10.1117/12.28044
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