1 February 1991 Coordinate measuring system for 2-D scanners
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Abstract
This paper investigates one of the possible designs of an optical-electronic system for identification of optical measuring signal parameters as a two-dimensional interference picture with spatial selection.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir V. Bukatin, Vladimir V. Bukatin, } "Coordinate measuring system for 2-D scanners", Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991); doi: 10.1117/12.28039; https://doi.org/10.1117/12.28039
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