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1 February 1991 Standards for oscillatory scanners
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Proceedings Volume 1454, Beam Deflection and Scanning Technologies; (1991)
Event: Electronic Imaging '91, 1991, San Jose, CA, United States
Optical scanner specifications are subject to a wealth of nonstandardization and scanner terminology to considerable misuse. The need for a standardization of terms and definitions is readily apparent to anyone involved in specifying or furnishing this technology. There is considerable debate as to the correct method of test or to the appropriate terminology for a given phenomenon. This paper proposes standard definitions and highlights test methods that appear either most common in industry or most correct. This is an attempt to stimulate discussion on standardization of terms and tests, the first step to a definitive standard. A glossary of terms is provided with brief definitions and justification, where required. Several of these terms, which require more extensive treatment to fully understand their intricacies and significance, are reviewed in a discussion section that follows. The included examination of test methods brings out subtleties in parameter definitions and the clear need for, as well as the difficulty in, standardization.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alan P. Ludwiszewski "Standards for oscillatory scanners", Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991);


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