In this paper, a general method of active pattern recognition based on attributes and reasoning (AAR) is proposed. The significance of this scheme is to treat active pattern recognition as a planning process of feature based reasoning and to represent the patterns as well as the sources of the patterns accordingly. The planning process of feature based reasoning in active pattern recognition is to examine the potentially 'important' features and to find the optimal feature or a set of features to recognize the source of patterns. This includes the ability to 'look for' the discriminating set of features when there exist some ambiguities among potential sources. This set of features which is being described as 'critical features' allows to collectively reason with symbolic attributes and to avoid unnecessary comparisons of patterns between the unknown source and a series of the model sources from a database.
B. Jin Chang, B. Jin Chang,
"Active pattern recognition based on attributes and reasoning", Proc. SPIE 1468, Applications of Artificial Intelligence IX, (1 March 1991); doi: 10.1117/12.45460; https://doi.org/10.1117/12.45460