1 March 1991 Basic manufacturability interval
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Abstract
The subject of control as it applies to a process or product embodies two components, namely detection and correction. The primary objective of this proposed interval/index is to combine the concepts of 'Shape and Location' in the form of an interval that will become a useful tool for control. This concept was developed to improve the often criticized indices that are in use today. Concerns associated with the standard Capability Index values, are based on the comments coming from the user population.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel A. Billings, Daniel A. Billings, "Basic manufacturability interval", Proc. SPIE 1468, Applications of Artificial Intelligence IX, (1 March 1991); doi: 10.1117/12.45486; https://doi.org/10.1117/12.45486
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