1 September 1991 High-spatial-resolution and high-sensitivity interferometric optical-time-domain reflectometer
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Abstract
An interferometric optical-time-domain reflectometer is presented. The system is a low- coherence interferometer using a superluminescent diode and has a spatial resolution of 20 micrometers . A high-sensitivity system is described which performs balanced and narrow band detections and has a detectable limit of -130 dB, which is 10 dB lower than the Rayleigh scattered light power in optical fibers. A polarization-independent system is proposed which adopts polarization-diversity detection to suppress the influence of the polarization fluctuation of the scattered light. A CO2 laser probing method is applied using the thermo- optic effect to identify scattering centers in optical circuits. Measurement of fault locations, reflectivity, and characterization of optical components with the systems are also described.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masaru Kobayashi, Masaru Kobayashi, Juichi Noda, Juichi Noda, Kazumasa Takada, Kazumasa Takada, Henry F. Taylor, Henry F. Taylor, } "High-spatial-resolution and high-sensitivity interferometric optical-time-domain reflectometer", Proc. SPIE 1474, Optical Technology for Signal Processing Systems, (1 September 1991); doi: 10.1117/12.44932; https://doi.org/10.1117/12.44932
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