Issues affecting the characterization of integrated optical devices subjected to ionizing radiation

Robert K. Hickernell; Norman A. Sanford; David H. Christensen

doi:10.1117/12.44919

1 September 1991 Issues affecting the characterization of integrated optical devices subjected to ionizing radiation

Robert K. Hickernell, Norman A. Sanford, David H. Christensen

Proceedings Volume 1474, Optical Technology for Signal Processing Systems; (1991) https://doi.org/10.1117/12.44919
Event: Orlando '91, 1991, Orlando, FL, United States

Abstract

We examine measurement issues which arise in the testing of integrated optical devices subjected to ionizing radiation. Many of these issues are not addressed by measurement procedures developed for optical fibers. We outline the complexities involved in the measurement of integrated optics as they relate to size, function, and materials. Pertinent waveguide parameters include attenuation, changes in refractive index, photorefractive effects, and polarization effects. Optical measurement techniques are reviewed, with particular attention paid to spatial and temporal resolution, dynamic range, and the capacity for remote measurement. Suggestions are made to improve the reliability of testing and allow better comparison between laboratories.

Citation Download Citation

Robert K. Hickernell, Norman A. Sanford, and David H. Christensen "Issues affecting the characterization of integrated optical devices subjected to ionizing radiation", Proc. SPIE 1474, Optical Technology for Signal Processing Systems, (1 September 1991); https://doi.org/10.1117/12.44919

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