Paper
1 August 1991 Optical cross-modulation method for diagnostic of powerful microwave radiation
A. V. Kozar, S. A. Krupenko
Author Affiliations +
Abstract
An electromagnetic-radiation diagnostics method is presented which is based on the interaction of intense microwave and laser infrared radiation with a semiconductor. Particular attention is given to the simultaneous effect of continuous microwave and optical infrared radiation on a crystalline silicon layer placed in a waveguide, the impact of this radiation on the mobility of free charge carriers and concentration of photocarriers, and an experimental method for studying the photocarrier diffusion caused by laser simulation of nonstationary microwave absorption in a semiconductor.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. V. Kozar and S. A. Krupenko "Optical cross-modulation method for diagnostic of powerful microwave radiation", Proc. SPIE 1476, Optical Technology for Microwave Applications V, (1 August 1991); https://doi.org/10.1117/12.45585
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KEYWORDS
Microwave radiation

Semiconductors

Absorption

Semiconductor lasers

Waveguides

Diagnostics

Silicon

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